Document :

ITU-T�SG 17� (Study Period 2017)� Temporary Document� 3206-PLEN

Title :

Revised baseline text for Z.169: Testing and Test Control Notation version 3: Using XML schema with TTCN-3 (for consent)

Date :

2020-07-15

Source :

Editor

AI/Question :

Q12/17

Access :

Restricted to TIES users�[ITU-T]