Document :

ITU-T�SG 17� (Study Period 2017)� Temporary Document� 640-PLEN

Title :

Draft Revised Z.169, Testing and Test Control Notation version 3: Using XML schema with TTCN-3 (for consent)

Date :

2017-08-27

Source :

Rapporteur Q12/17

AI/Question :

Q12/17

Access :

Restricted to TIES users�[ITU-T]