[2162-GEN]� Draft Recommendation ITU-T K.gm " Test Methods and preferred values for hybrid integrated circuit components containing gas discharge tube and metal oxide varistor technologies" discussed during Virtual meeting Virtual, 30 November

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[2162-GEN]� Draft Recommendation ITU-T K.gm " Test Methods and preferred values for hybrid integrated circuit components containing gas discharge tube and metal oxide varistor technologies" discussed during Virtual meeting Virtual, 30 November - 10 December 2021

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English	Word �	107735 bytes	2021-12-07	[2162-GEN]�

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Document :	ITU-T�SG 5� (Study Period 2017)� Temporary Document� 2162-GEN
Title :	Draft Recommendation ITU-T K.gm " Test Methods and preferred values for hybrid integrated circuit components containing gas discharge tube and metal oxide varistor technologies" discussed during Virtual meeting Virtual, 30 November - 10 December 2021
Date :	2021-12-07
Source :	Rapporteur Q2/5
AI/Question :	Q2/5
Access :	Restricted to TIES users�[ITU-T]

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