Document :

ITU-T�SG04� (Study Period 2005)� Contribution� 22

Title :

Addition of test patterns and modification of phase insertion method in Appendix VIII/O.172

Date :

2007-08-17

Source :

CIAJ

AI/Question :

Q5/4

Meeting :

2007-08-28

Access :

Restricted to TIES users�[ITU-T]