[777-GEN]� LS/i/r on evaluating the leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to SG5-LS101; SG5-LS102; SG15-LS188) [from ITU-R WP5B]

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P�gina principal : UIT-T : SG 9 : Documentos Temporales�(Reuni�n�2016-01-21) : 777-GEN

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[777-GEN]� LS/i/r on evaluating the leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to SG5-LS101; SG5-LS102; SG15-LS188) [from ITU-R WP5B]

	Formato	Tama�o	Puesta a disposici�n

English	Word �	91136 octetos	2015-07-30	[777-GEN]�

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Documento :	UIT-T�SG 9� (Periodo de estudios 2013)� Documento Temporale� 777-GEN
T�tulo :	LS/i/r on evaluating the leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to SG5-LS101; SG5-LS102; SG15-LS188) [from ITU-R WP5B]
Recibido en :	2015-07-29
Origen :	ITU-R WP5B
AI/Cuesti�n :	Q1/9, Q7/9
Disponibilidad :	Restringido a usuarios de TIES�[UIT-T]

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Actualizado el :�2015-07-30

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