[1728-GEN]� Draft LS/o/r on leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to SG9 - LS 164 -E) and (reply to ITU-R WP 1A - Document 1A/TEMP/22 -E) [to ITU-T SG9 and ITU-R WP1A]

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P�gina principal : UIT-T : SG 5 : Documentos Temporales�(Reuni�n�2016-10-10) : 1728-GEN

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[1728-GEN]� Draft LS/o/r on leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to SG9 - LS 164 -E) and (reply to ITU-R WP 1A - Document 1A/TEMP/22 -E) [to ITU-T SG9 and ITU-R WP1A]

	Formato	Tama�o	Puesta a disposici�n

English	Word �	47104 octetos	2016-10-12	[1728-GEN]�Revision 1
	Word �	46592 octetos	2016-10-11	[1728-GEN]�

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Documento :	UIT-T�SG 5� (Periodo de estudios 2013)� Documento Temporale� 1728-GEN
T�tulo :	Draft LS/o/r on leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to SG9 - LS 164 -E) and (reply to ITU-R WP 1A - Document 1A/TEMP/22 -E) [to ITU-T SG9 and ITU-R WP1A]
Recibido en :	2016-10-11
Origen :	Rapporteur Q8/5 , Chairman ITU-T SG5
AI/Cuesti�n :	Q8/5
Disponibilidad :	Restringido a usuarios de TIES�[UIT-T]

Comienzo de la p�gina�-� Comentarios�-� Cont�ctenos�-� Copyright � UIT�2008�Reservados todos los derechos
Contacto p�blico :� TSB EDH
Actualizado el :�2016-10-12

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