[1620-GEN]� LS/i/r on leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-T SG5-LS121) [from ITU-T SG9]

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P�gina principal : UIT-T : SG 5 : Documentos Temporales�(Reuni�n�2016-10-10) : 1620-GEN

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[1620-GEN]� LS/i/r on leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-T SG5-LS121) [from ITU-T SG9]

	Formato	Tama�o	Puesta a disposici�n

English	Zip (Document) �	713940 octetos	2016-09-14	[1620-GEN]�

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Documento :	UIT-T�SG 5� (Periodo de estudios 2013)� Documento Temporale� 1620-GEN
T�tulo :	LS/i/r on leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-T SG5-LS121) [from ITU-T SG9]
Recibido en :	2016-09-14
Origen :	ITU-T SG9
AI/Cuesti�n :	Q6/5, Q8/5
Disponibilidad :	Restringido a usuarios de TIES�[UIT-T]

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Contacto p�blico :� TSB EDH
Actualizado el :�2016-09-14

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