[64-WP1]� Addition of test patterns and modification of phase insertion method in Appendix VIII/O.172 (Revised COM4-C22)

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[64-WP1]� Addition of test patterns and modification of phase insertion method in Appendix VIII/O.172 (Revised COM4-C22)

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Documento :	UIT-T�SG04� (Periodo de estudios 2005)� Documento Temporale� 64-WP1
T�tulo :	Addition of test patterns and modification of phase insertion method in Appendix VIII/O.172 (Revised COM4-C22)
Recibido en :	2007-09-05
Origen :	Rapporteur, Question 5/4
AI/Cuesti�n :	Q5/4
Disponibilidad :	Restringido a usuarios de TIES�[UIT-T]

Comienzo de la p�gina�-� Comentarios�-� Cont�ctenos�-� Copyright � UIT�2008�Reservados todos los derechos
Contacto p�blico :� TSB EDH
Actualizado el :�2007-09-05

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