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[745]� ITU-T Rec. K.147 (06/2020) Ethernet port resistibility testing for overvoltages and overcurrents

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English

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4661750 bytes 2021-03-31 [745]�Addendum 1

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4664325 bytes 2021-04-08 [745]�Revision 1

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8643935 bytes 2021-03-17 [745]�

Document :

ITU-T�SG 5� (Study Period 2017)� Contribution� 745

Title :

ITU-T Rec. K.147 (06/2020) Ethernet port resistibility testing for overvoltages and overcurrents

Date :

2021-03-16

Source :

IEEE (IEEE 802.3)

AI/Question :

Q2/5

Meeting :

2021-05-11

Access :

Restricted to TIES users�[ITU-T]

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