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[2075]� Sub-Nyquist Artefacts and Sampling Moir� Effects when Measuring PTP to PTP and PTP to 1 PPS Noise Transfer (G.8272.3, G.supp)

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Document :

ITU-T�SG 15� (Study Period 2013)� Contribution� 2075

Title :

Sub-Nyquist Artefacts and Sampling Moir� Effects when Measuring PTP to PTP and PTP to 1 PPS Noise Transfer (G.8272.3, G.supp)

Date :

2016-09-06

Source :

Huawei Technologies Co., Ltd.

AI/Question :

Q13/15

Meeting :

2016-09-19

Access :

Restricted to TIES users�[ITU-T]

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