[1620-GEN]� LS/i/r on leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-T SG5-LS121) [from ITU-T SG9]

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[1620-GEN]� LS/i/r on leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-T SG5-LS121) [from ITU-T SG9]

	Format	Size	Posted

English	Zip (Document) �	713940 bytes	2016-09-14	[1620-GEN]�

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Document :	ITU-T�SG 5� (Study Period 2013)� Temporary Document� 1620-GEN
Title :	LS/i/r on leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-T SG5-LS121) [from ITU-T SG9]
Date :	2016-09-14
Source :	ITU-T SG9
AI/Question :	Q6/5, Q8/5
Access :	Restricted to TIES users�[ITU-T]

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