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[175-WP3]� Quality Assessment Test Plan for ITU-T G.722 PLC selection phase

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1178112 bytes 2006-10-27 [175-WP3]�

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Document :

ITU-T�SG16� (Study Period 2005)� Temporary Document� 175-WP3

Title :

Quality Assessment Test Plan for ITU-T G.722 PLC selection phase

Date :

2006-10-27

Source :

Rapporteur Q10/16

AI/Question :

Q10/16

Access :

Restricted to TIES users�[ITU-T]

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