[536-GEN]� K.Suppl-Harmonization: "The impact of RF-EMF exposure limits stricter than the ICNIRP or IEEE guidelines on 4G and 5G mobile network deployment"

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P�gina principal : UIT-T : SG 5 : Documentos Temporales�(Reuni�n�2018-05-21) : 536-GEN

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[536-GEN]� K.Suppl-Harmonization: "The impact of RF-EMF exposure limits stricter than the ICNIRP or IEEE guidelines on 4G and 5G mobile network deployment"

	Formato	Tama�o	Puesta a disposici�n

English	Zip (Document) �	1175184 octetos	2018-05-24	[536-GEN]�Revision 4
	Zip (Document) �	1128971 octetos	2018-05-23	[536-GEN]�Revision 3
	Zip (Document) �	1130729 octetos	2018-05-23	[536-GEN]�Revision 2
	Word �	749582 octetos	2018-05-23	[536-GEN]�Revision 1
	Word �	830097 octetos	2018-05-22	[536-GEN]�

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Documento :	UIT-T�SG 5� (Periodo de estudios 2017)� Documento Temporale� 536-GEN
T�tulo :	K.Suppl-Harmonization: "The impact of RF-EMF exposure limits stricter than the ICNIRP or IEEE guidelines on 4G and 5G mobile network deployment"
Recibido en :	2018-05-22
Origen :	Rapporteur Q3/5
AI/Cuesti�n :	Q3/5
Disponibilidad :	Restringido a usuarios de TIES�[UIT-T]

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Contacto p�blico :� TSB EDH
Actualizado el :�2018-05-24

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