Document :

ITU-T�SG 5� (Study Period 2017)� Temporary Document� 533-GEN

Title :

A.1 justification for a new work item on K.reflection - "Impact of the metallic structures for the EMF exposure level"

Date :

2018-05-22

Source :

Rapporteur Q3/5

AI/Question :

Q3/5

Access :

Restricted to TIES users�[ITU-T]