[806-GEN]� LS/i/r evaluating the leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-R WP5B-5B/TEMP/399-E, ITU-R WP1A-1A/TEMP/103-E, ITU-R WP1A-1A/TEMP/101-E) [from ITU-T SG5]

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[806-GEN]� LS/i/r evaluating the leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-R WP5B-5B/TEMP/399-E, ITU-R WP1A-1A/TEMP/103-E, ITU-R WP1A-1A/TEMP/101-E) [from ITU-T SG5]

	Format	Size	Posted

English	Zip (Document) �	821401 bytes	2015-12-08	[806-GEN]�

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Document :	ITU-T�SG 9� (Study Period 2013)� Temporary Document� 806-GEN
Title :	LS/i/r evaluating the leakage and impact of radio frequency noise from telecommunication systems using metallic conductors (reply to ITU-R WP5B-5B/TEMP/399-E, ITU-R WP1A-1A/TEMP/103-E, ITU-R WP1A-1A/TEMP/101-E) [from ITU-T SG5]
Date :	2015-12-08
Source :	ITU-T SG5
AI/Question :	Q13/9
Access :	Restricted to TIES users�[ITU-T]

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