Document :

ITU-T�SG 16� (Study Period 2009)� Temporary Document� 213-WP3

Title :

G.729.1-VAD-Layer: Characterization phase processing test plan

Date :

2011-08-04

Source :

Rapporteur Q10/16

AI/Question :

Q10/16

Access :

Restricted to TIES users�[ITU-T]