�1���� Scope�
�2���� References�
������� 2.1���� Normative references���������
������� 2.2���� Informative references��������
�3���� Definitions��
�4���� Abbreviations���
�5���� Conventions�����
�6���� Functional block diagram�
�7���� Interfaces���
������� 7.1���� Optical interfaces���
������� 7.2���� Electrical interfaces
������� 7.3���� External reference clock
input��������
������� 7.4���� Input interface
sensitivity����
�8���� Jitter/wander generation function��
������� 8.1���� Modulation source�
������� 8.2���� Clock generator�����
������� 8.3���� Digital test pattern
generator�����������
������� 8.4���� Pointer sequence
generator
������� 8.5���� Minimum jitter/wander
generation capability�����������
������� 8.6���� Generation accuracy����������
�9���� Jitter measurement function����������
������� 9.1���� Reference timing signal�������
������� 9.2���� Measurement capabilities���
������� 9.3���� Measurement bandwidths��
������� 9.4���� Measurement accuracy������
������� 9.5���� Jitter transfer
measurement accuracy����������
������� 9.6���� Additional facilities�
10����
Wander
measurement function����
������ 10.1���� Reference timing signal������
������ 10.2���� Measurement of TIE (Time
Interval Error)�
������ 10.3���� Measurement of transient
TIE (Time Interval Error)�����������
������ 10.4���� Measurement of MTIE
(Maximum Time Interval Error)�����
������ 10.5���� Measurement of TDEV
(Time Deviation)��
������ 10.6���� Measurement of frequency
offset���
������ 10.7���� Measurement of frequency
drift rate����������
11����
TDEV
wander noise generation function��
12����
MTIE wander noise generation function���
13����
Operating
environment����
Annex A�Structured
test signals for the measurement of jitter����
������� A.1���� Introduction����������
������� A.2���� Test signal structure
for STM‑N signals�����
������� A.3���� Test signal structure
for concatenated STM‑N signals��������
Annex B�Definition
of band-limited peak-to-peak phase slope error����
Annex C�MTIE
upper limit for TDEV wander noise����
Appendix I�Guidelines
concerning the measurement of jitter in SDH systems����
Appendix II�Guidelines
concerning the measurement of wander in SDH systems����
������ II.1���� Wander measurements�������
������ II.2���� Clock stability
measurements����������
Appendix
III�Guidelines
concerning the generation of pointer test sequences����
Appendix IV�Total
jitter measurement function response����
������ IV.1���� Introduction����������
������ IV.2���� Measurement filter
parameters������
������ IV.3���� Mask limits for
high-pass measurement filter response��������
Appendix V�Verification
of MTIE and TDEV calculation algorithms����
������� V.1����
TIE noise source functional description������
������� V.2���� First example of TIE
noise generator���������
������� V.3���� Second example of TIE
noise generator�����
Appendix VI�MTIE
generation evaluation����
Appendix VII�Method
for verification of measurement result accuracy and intrinsic fixed error����
����� VII.1���� Verification description
and application�����
����� VII.2���� System implementation�����
����� VII.3���� Results and
interpretation��
Appendix VIII�Method
for characterization of transmit intrinsic jitter����
���� VIII.1���� Verification description
and application�����
���� VIII.2���� Method�
���� VIII.3���� Diagnostic test pattern������
���� VIII.4���� Calculation of
peak-to-peak value from the probability distribution function����