Rec. ITU-T O.150 (10/1992) � DIGITAL TEST PATTERNS FOR PERFORMANCE MEASUREMENTS ON DIGITAL TRANSMISSION EQUIPMENT
FOREWORD
1 Introduction
2 Need for standardized test patterns
3 Properties of pseudo-random test patterns
    3.1 Error measurements through scramblers
    3.2 Loss of sequence synchronization
    3.3 �Framed� measurements
    3.4 Jitter measurements
4 Digital test patterns defined in the O-Series Recommendations
    4.1 511-bit pseudo-random test pattern
    4.2 2047-bit pseudo-random test pattern
    4.3 32 767-bit pseudo-random test pattern
    4.4 1 048 575-bit pseudo-random test pattern
    4.5 1 048 575-bit pseudo-random test pattern
    4.6 8 388 607-bit pseudo-random test pattern
References